SPAIN: The University of New Hampshire Interoperability Laboratory (UNH-IOL), an independent provider of broad-based testing and standards conformance services for the networking industry, announced that the lab is demonstrating its MIPI testing services for mobile device components suppliers this week at Mobile World Congress 2013 in Barcelona, Spain.
In collaboration with the MIPI Alliance and leading test and measurement equipment suppliers such as Agilent Technologies Inc., the UNH-IOL is facilitating the production of less expensive mobile devices, including smartphones, tablets and ultrabooks, which offer improved performance, higher resolution images and superior video quality.
The UNH-IOL and Agilent are co-hosting the MIPI Test Corner, a section of the MIPI Alliance booth number 8.1E46, located in Hall 8.1 at Fria Gran Via. Booth visitors will see a demonstration of rigorous conformance testing performed on mobile device components implementing MIPI specifications.
This demonstration of MIPI specifications for non-MIPI member companies focuses on D-PHY, the current standard for physical layer signaling in camera and display interface applications. The UNH-IOL’s experienced technical staff are utilizing Agilent’s Infiniium MSO9404A oscilloscope to perform testing on mobile components including Synopsys’ DesignWare MIPI D-PHY IP Solution.
Combined with the UNH-IOL’s custom D-PHY GUI software, the Agilent platform provides the ability to capture and analyze D-PHY signaling, which is necessary to perform the UNH-IOL D-PHY Transmitter Physical Layer Conformance Test Suite.
“MIPI Alliance is dedicated to addressing complexity and costs associated with mobile device production,” said Joel Huloux, Chairman of the Board of MIPI Alliance. “Our focus on test and interoperability – as demonstrated by our MIPI Test Corner – translates into specifications which are designed for easy deployment by the mobile device ecosystem. We are pleased to see the UNH-IOL and Agilent demonstrate the testability of our D-PHY physical layer.”